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Netherlands – Microelectronic machinery and apparatus and microsystems – Metrology SEM+FIB system
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNONetherlandsPublished on Jul 27, 2026
41 days left
NetherlandsDescription
The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross-section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Leveraging a single SEM + FIB system
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Microelectronic machinery and apparatus and microsystemsMiscellaneous evaluation or testing instruments
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Sign in for an AI summaryContains data from Tenders Electronic Daily (TED), © European Union, ted.europa.eu — CC BY 4.0.
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