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Germany – Instruments for measuring electrical quantities – 300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz
IHP GmbH - Leibniz-Institut für innovative MikroelektronikGermanyPublished on Jun 15, 2026
Deadline passed
GermanyDescription
300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz
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Instruments for measuring electrical quantitiesMachines and apparatus for testing and measuring
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Sign in for an AI summaryContains data from Tenders Electronic Daily (TED), © European Union, ted.europa.eu — CC BY 4.0.
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