Natrag na pretraživanje
Belgija – Laboratorijska, optička i precizna oprema (osim naočala) – WAFER-COMPATIBELE PLASMA GEFOCUSTE IONENBUNDEL-SCANNING ELEKTRONENMICROSCOOP (PFIB-SEM) SYSTEEM
Imec EU Pilot line NVBelgijaObjavljeno na 03. lip 2026.
Nije naveden rok
BelgijaOpis
WAFER-SPOSOBAN PLASMA FOCUSIRANI IONSKI SNOP SKENIRANI ELEKTRONSKI MIKROSKOP (PFIB-SEM) SUSTAV
CPV kodovi
Laboratory, optical and precision equipments (excl. glasses)
Dokumenti i prijava
Sažetak AI
Prijavi se za sažetak AIContains data from Tenders Electronic Daily (TED), © European Union, ted.europa.eu — CC BY 4.0.
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