Švedija – Mikroskopai – Atomic Force Microscope (AFM)

Atominė jėgos mikroskopas (AFM) filmuotų paviršių ir paviršių charakterizavimui tiek sausose sąlygose, tiek skysčių alyginant.

**Technical specifications:**

- **Resolution:** 0.1 nm

- **Scan range:** 90 µm x 90 µm

- **Maximum sample size:** 200 mm x 200 mm

- **Z-range:** 15 µm

- **Scanning speed:** up to 200 Hz

- **Environmental conditions:** ambient, vacuum, and liquid

- **Operating modes:** contact, non-contact, tapping, and force spectroscopy

- **Software:** Gwyddion, WSxM, and custom software for data analysis and visualization

**Additional requirements:**

- **Delivery time:** within 6 months from the date of order confirmation

- **Warranty:** 2 years

- **Training:** on-site training for 2 days by the manufacturer's representative

- **Maintenance:** annual maintenance contract for 3 years

- **Spare parts:** availability of spare parts for at least 5 years

- **Compliance:** CE marking and conformity with the relevant EU directives

**TED Notice:** 2023/S 000-000000

**Contact point(s):**

- **Name:** Dr. John Doe

- **Organisation:** European Commission

- **Email:** [email protected]

- **Telephone:** +32 2 222 22 22

- **Fax:** +32 2 222 22 23