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Hollandia – Mikroelektronikai gépek, berendezések és mikrorendszerek – Metrology SEM+FIB system
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNOPaíses BaixosPublicado em 27 de jul. de 2026
41 dias restantes
Países BaixosDescrição
The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Levering van één SEM +FIB systeem
Códigos CPV
Microelectronic machinery and apparatus and microsystemsMiscellaneous evaluation or testing instruments
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Faça login para um resumo da IAContains data from Tenders Electronic Daily (TED), © European Union, ted.europa.eu — CC BY 4.0.
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