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Hollandia – Mikroelektronikai gépek, berendezések és mikrorendszerek – Metrology SEM+FIB system
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNOȚările de JosPublicat pe 27 iul. 2026
41 zile rămase
Țările de JosDescriere
The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Levering van één SEM +FIB systeem
Coduri CPV
Microelectronic machinery and apparatus and microsystemsMiscellaneous evaluation or testing instruments
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Conectează-te pentru un rezumat AIContains data from Tenders Electronic Daily (TED), © European Union, ted.europa.eu — CC BY 4.0.
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