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Sweden – Checking and testing apparatus – Semiautomatic ellipsometer
Kungliga Tekniska högskolanSwedenPublished on Oct 11, 2026
Deadline passed
SwedenDescription
KTH is seeking a spectroscopic ellipsometer with automatic wafer-mapping capability for measurement of thin film thickness and optical constants (n, k), for installation in the Electrum Laboratory cleanroom.
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Checking and testing apparatus
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