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Germany – Scanning electron microscopes – in situ Rasterelektronenmikroskop (in situ SEM)
Freistaat Bayern, vertreten durch die Universität BayreuthGermanyPublished on Oct 27, 2026
30 days left
GermanyDescription
An in situ Scanning Electron Microscope (SEM) is to be procured, which will be used as a key instrument in the local, multiscale operando analysis of heterogeneous catalysts and battery materials.
CPV codes
Scanning electron microscopes
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Sign in for an AI summaryContains data from Tenders Electronic Daily (TED), © European Union, ted.europa.eu — CC BY 4.0.
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