Germany – Scanning probe microscopes – Höchstauflösendes Rasterkraftmikroskop (AFM)

The subject of the procurement is a high-resolution atomic force microscope (AFM) including all necessary hardware and software components for operation. The system is used for high-resolution characterization of surfaces and interfaces on the nano- and atomic scale, particularly for 3D-AFM measurements in liquids and drift-free long-term measurements in research applications.