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Belgium – Laboratory, optical and precision equipments (excl. glasses) – WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM
Imec EU Pilot line NVBelgiumPublished on Jun 03, 2026
No deadline given
BelgiumDescription
WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM
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Laboratory, optical and precision equipments (excl. glasses)
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Sign in for an AI summaryContains data from Tenders Electronic Daily (TED), © European Union, ted.europa.eu — CC BY 4.0.
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