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Germany – Scanning electron microscopes – Rasterelektronenmikroskop Starke
Hochschule KaiserslauternGermanyPublished on Aug 03, 2026
Deadline passed
GermanyDescription
Procurement of a scanning electron microscope (SEM) with atomic force/magnetic force microscopy module (AFM/MFM), including delivery, installation and commissioning.
CPV codes
Scanning electron microscopesMiscellaneous compounds for microscopes
Documents & submission
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Sign in for an AI summaryContains data from Tenders Electronic Daily (TED), © European Union, ted.europa.eu — CC BY 4.0.
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