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Germany – Scanning electron microscopes – Rasterelektronenmikroskop Starke
Hochschule KaiserslauternGermanyPublished on Aug 03, 2026
37 days left
GermanyDescription
Beschaffung eines Rasterelektronenmikroskops (REM) mit Raster-Kraft-/Magnet-Kraft-Mikroskopie-Modul (AFM/MFM) einschließlich Lieferung, Installation und Inbetriebnahme.
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Scanning electron microscopesMiscellaneous compounds for microscopes
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Sign in for an AI summaryContains data from Tenders Electronic Daily (TED), © European Union, ted.europa.eu — CC BY 4.0.
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