Germany – Surface observing apparatus – High resolution X-ray inspection tool

The Fraunhofer Institute for Microstructure of Materials and Systems IMWS investigates the application behaviour, reliability, safety and lifetime of innovative materials in components and systems. The Business Unit “Electronic Materials and Components” of Fraunhofer IMWS supports industry and research partners with its internationally recognised expertise in failure analyses of electronic components. Fraunhofer IMWS will enhance its capabilities for advanced failure analysis and material characterisation to support the ramp-up of new heterogeneous integration technologies addressing the manufacturing and reliability challenges. To enable the non-destructive detection and evaluation of structural deviations, contact defects, damage characteristics and their most precise possible localisation in the package to enable further high-resolution physical diagnostics, the latest generation of radiography (2D) and X-ray tomography (3D-CT) systems are required in particular for the non-destructive detection and evaluation of structural deviations, contact defects, damage characteristics and their most precise possible localisation in the package to enable further high-resolution physical diagnostics. A high-performance multi-processor workstation is required for post-processing of the generated imaging data sets to identify tiny deviations and defects within the devices. This tender is for the supply of a fully functional device including assembly, commissioning and all necessary connections, approvals/certifications and software for operation. The requirements for a state-of-the-art X-ray inspection tool for highly integrated 2.5/3D components are described below: